X-RAY CRYSTALLOGRAPHIC TECHNOLOGY

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X-RAY CRYSTALLOGRAPHIC TECHNOLOGY

ANDRE GUINIER
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Tahun:
1952
Penerbit:
HILGER AND WATTS LTD
Bahasa:
chinese
Halaman:
330
ISBN:
10457899
Fail:
PDF, 14.57 MB
IPFS:
CID , CID Blake2b
chinese, 1952
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Istilah utama

 
tube
rays
ray
lattice
current
anticathode
intensity
crystal
planes
plane
cathode
wavelength
wavelengths
absorption
radiation
electron
atoms
spectrum
continuous
wave
crystallography
diffraction
focus
tubes
chamber
axis
crystallographic
angle
emitted
atom
atomic
electrons
parallel
pump
filament
scattered
technology
tension
surface
sealed
demountable
necessary
radiations
waves
coefficient
crystals
formula
incident
photon
function
tungsten
characteristic
equal
intensities
reflection
vacuum
difference
element
ionization
diffracted